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DFT Digest: Expanding design-for-test in an ever-shring world…
Design for test, Design-for-Test (DFT) discussion, education, and best-practices, including Scan, ATPG, BIST, Memory BIST, Logic BIST, Test Compression, ...
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electronic design automation
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testability
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best-practices
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fault coverage
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ibist
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test compression
www.dftdigest.com - 2009-02-08
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